Predictive analytics and automation software for semiconductor manufacturing
yieldWerx is a US-based, end-to-end data and yield analytics platform designed to manage large-scale, high-dimensional semiconductor manufacturing data for MicroLED, image sensor, and AR/VR/XR products with full lifecycle traceability.
The platform unifies and correlates heterogeneous data across the full manufacturing lifecycle, from fab process and pixel-level parametrics through assembly, module, and final test, delivering system-level yield insight at extreme scale. Proven in high-density MicroLED production with over 10 billion data points per wafer, yieldWerx provides pixel-level clustering analytics, ASIC and pixel data correlation, defect image overlay, AI-driven outlier detection, and end-to-end traceability from wafer to pixel to module to device. The result is faster root cause analysis, eliminated data silos, and accelerated yield learning for the world’s most demanding display and sensing applications.