Testing and inspection tools for the microLED industry.
InZiv provides testing and inspection tools for the microLED industry. InZiv’s technology offers one comprehensive platform for both full wafer mapping and individual chip testing and characterization at the highest resolution. Automated PL and EL provide today’s most critical measurements, including EQE and angular measurements, and Nano-PL and Nano-EL enable the user to zoom in on individual chips and sub-pixel features and defects with 100nm resolution.
InZiv integrates multiple inspection modalities in one system, and provides a comprehensive analysis of both the whole wafer and its sub-pixel features. This unique combination empowers microLED developers and manufacturers with the ability to better understand the relationship between light, color, current, and structure – directly addressing today’s most critical challenges in microLED.